logo
Bericht versturen
1154 Results For

"spectrophotometer parts"

KWALITEIT TFT 3,5“ Multihoek polijst Materiaal NHG268 van de Meter het Draagbare Glanzende Test om Byk te vervangen polijst Meter Fabriek

TFT 3,5“ Multihoek polijst Materiaal NHG268 van de Meter het Draagbare Glanzende Test om Byk te vervangen polijst Meter

Silk gloss meter portable glossy test equipment with 20 60 85 tri angle NHG268 to replace byk gloss meter Introduction: NHG268 gloss meter features with 20, 60 and 85° angle, manufactured according to ISO2813 and GB/T 9754. It is also compatible with the standards of ASTM D523, ASTM D2457. NHG268 conforms to JJG696 first class gloss meter working requirement, corresponding with CIE 1931(2°) under CIE C light source. NHG268 gloss meter can test material with high gloss (0

KWALITEIT 20 60 85 Graad Multihoek polijsten Meter2000gu Autokaliberbepaling NHG268 0.1GU voor Autoverf Fabriek

20 60 85 Graad Multihoek polijsten Meter2000gu Autokaliberbepaling NHG268 0.1GU voor Autoverf

20 60 85 Degree 2000gu Tri-angle Gloss Meter Auto Calibration NHG268 0.1GU For Car Paint with PC Software Introduction: NHG268 gloss meter features with 20, 60 and 85° angle, manufactured according to ISO2813 and GB/T 9754. It is also compatible with the standards of ASTM D523, ASTM D2457. NHG268 conforms to JJG696 first class gloss meter working requirement, corresponding with CIE 1931(2°) under CIE C light source. NHG268 gloss meter can test material with high gloss (0

KWALITEIT Polijst de Multihoek van het 3,5 Duimtouche screen Meter Silk 20 60 85 Nevel NHG268 2000gu Fabriek

Polijst de Multihoek van het 3,5 Duimtouche screen Meter Silk 20 60 85 Nevel NHG268 2000gu

Silk gloss meter 20 60 85 haze meter NHG268 3.5 inch touch screen glossmeter for 2000 gu glossy measurement Introduction: NHG268 gloss meter features with 20, 60 and 85° angle, manufactured according to ISO2813 and GB/T 9754. It is also compatible with the standards of ASTM D523, ASTM D2457. NHG268 conforms to JJG696 first class gloss meter working requirement, corresponding with CIE 1931(2°) under CIE C light source. NHG268 gloss meter can test material with high gloss (0

KWALITEIT 254000DPI van de de Testgrafiek YE0260 van de nauwkeurigheidsreflectiecoëfficiënt van het de Testdoel het Optische Doel van de de Vervormingspunt Fabriek

254000DPI van de de Testgrafiek YE0260 van de nauwkeurigheidsreflectiecoëfficiënt van het de Testdoel het Optische Doel van de de Vervormingspunt

Product Description Specification Model YE0260 Type Reflectance Size 280*157.5mm A280 Ratio 16:9 Material HD photographic paper Dot Pattern Test Chart is for testing chromatic aberration and SMIA TV Distortion. Standard Transparent/Reflectance Test Chart Size Size Picture size(4:3) Picture size(16:9) Chart Size(16:9) A280 280*210mm 280*157.5mm 365*305mm D240 240*180mm 240*135mm 320*290mm D280 280*210mm 80*157.5mm 360*280mm ISO 12233 Resolution Test Chart Size Model Specificat

KWALITEIT ISO2813 polijst de Multihoek van Standard Silk Nhg268 2000gu Meter Fabriek

ISO2813 polijst de Multihoek van Standard Silk Nhg268 2000gu Meter

Silk nhg268 multi-angle precise gloss meter tri glossmeter with 2000gu ISO2813 standard Introduction: NHG268 gloss meter features with 20, 60 and 85° angle, manufactured according to ISO2813 and GB/T 9754. It is also compatible with the standards of ASTM D523, ASTM D2457. NHG268 conforms to JJG696 first class gloss meter working requirement, corresponding with CIE 1931(2°) under CIE C light source. NHG268 gloss meter can test material with high gloss (0-2000Gu), and universall

KWALITEIT de metingsinstrumenten van de spectophotometerys4560 kleur met het programma van de kleurengelijke Fabriek

de metingsinstrumenten van de spectophotometerys4560 kleur met het programma van de kleurengelijke

45/0 geometry Silk horizental type of spectophotometer YS4560 colour measurement instruments with color match program Brief Introduction YS4560 Advanced Spectrophotometer uses 45/0 (45 degree ring illumination, 0 degree reception) geometric optical structure in accordance with CIE No. 15 and adopts concave grating spectrometry to accurately measure sample reflectance and various colorimetric data; The instrument is equipped with Φ8, Φ4mm double measuring aperture, used for

KWALITEIT van de de Hoekd/8 Kleur van 400-700nm 10° de Analysatormeter Silk TS7020 Fabriek

van de de Hoekd/8 Kleur van 400-700nm 10° de Analysatormeter Silk TS7020

Product Description TS7020 is Silk using autonomous core technology research and development of A portable light color difference instrument, is the high level in spectral architecture color difference instrument, in addition to ensure accurate relative Δ E at the same time, also to ensure the accuracy of the absolute value of L, A and B for A long time, anytime, anywhere can pass the international standards and national standards of measurement. Using the built-in silicon

KWALITEIT Sc.i-SCE TS3036 Silk Machine 8mm van het Kleurenspectrum Openingen Fabriek

Sc.i-SCE TS3036 Silk Machine 8mm van het Kleurenspectrum Openingen

Product Description Silk color spectrum machine portable spectrocolorimeter TS3036 with 4 apertures 8mm and 4mm TS7036 is Silk using autonomous core technology research and development of A portable light color difference instrument, is the high level in spectral architecture color difference instrument, in addition to ensure accurate relative Δ E at the same time, also to ensure the accuracy of the absolute value of L, A and B for A long time, anytime, anywhere can pass the

KWALITEIT TS7030 8mm de UV Lichtbron van de OpeningsSilk Colorimeter 400~700nm Fabriek

TS7030 8mm de UV Lichtbron van de OpeningsSilk Colorimeter 400~700nm

Product Description China spectophotometre Silk TS7030 8mm aperture colorimeter manufacturer with 400~700nm UV light source TS7030 is 3 nh using autonomous core technology research and development of A portable light color difference instrument, is the high level in spectral architecture color difference instrument, in addition to ensure accurate relative Δ E at the same time, also to ensure the accuracy of the absolute value of L, A and B for A long time, anytime, anywhere

KWALITEIT Van de Colorimetercie van CR2 Silk LAB LCH Jagerslab SRGB XYZ LIEFDE Hunter Lab Colorimeter Fabriek

Van de Colorimetercie van CR2 Silk LAB LCH Jagerslab SRGB XYZ LIEFDE Hunter Lab Colorimeter

Specifications Product Name & Model CR2(Professional Edition) ColorReader Geometry D/8(Diffuse illuminance, 8°reception, SCI), Conforms to standards CIE No.15,GB/T 3978. Features Used for colordifference quality control in plastic electronics, paint and coating, textile and garment printing and dyeing, ceramics and other industries; Small size, easy to carry, search for the color cards and multifunction expanded through smartphone APP Integrating sphere size Φ20mm Illuminant

KWALITEIT Verlichting die de Zak van Colorimeter Bluetooth 5,0 de plaats bepalen van Silk CR2 8mm Opening Fabriek

Verlichting die de Zak van Colorimeter Bluetooth 5,0 de plaats bepalen van Silk CR2 8mm Opening

Product Description Specification Product Name & Model CR2(Professional Edition) ColorReader Geometry D/8(Diffuse illuminance, 8°reception, SCI), Conforms to standards CIE No.15,GB/T 3978. Features Used for color difference quality control in plastic electronics, paint and coating, textile and garment printing and dyeing, ceramics and other industries; Small size, easy to carry, search for the color cards and multifunction expanded through smartphone APP Integrating sphere

KWALITEIT Van de de Overbrengingsmeter van Silk YH1000 de Lichte Norm van Haze Meter ASTM D1003 Fabriek

Van de de Overbrengingsmeter van Silk YH1000 de Lichte Norm van Haze Meter ASTM D1003

Silk YH1000 Light Transmittance Meter Haze Meter ASTM D1003 Standard Specification Haze Meter Silk YH1000 Light Transmittance Instrument with ASTM D1003 Standard YH1000 haze meter can easily achieve ASTM D1003 non-compensation method, full light transmittance, haze test. Open sample bin can be vertically and horizontally tested to accommodate more samples to be tested.The YH1000 haze meter uses a PDF array detector to meet the CIE V(λ)2 degree visual response. The compensation